The Keithley 2260B-30-108 30V/108A/1080W Programmable DC Power Supply has programmable rise time (or slew rate) control to prevent potentially dangerous inrush currents from flowing into loads that have low resistance when power is initially supplied. Either voltage or current rise time can be controlled. With voltage slew rate control, voltage rise time can range from a slow, 0.1V/s to a high speed of 1600V/s for the 800V supplies. Programming a current rise time puts the 2260B-30-108 in a constant current control priority mode in which the current slew rate limits the rate at which the voltage rises across the device under test (DUT). In addition to controlling rise time, fall time can also be programmed; fall time values can be different from rise time values. Delivery of power to a load can be precisely controlled to prevent overshoot spikes and excessive amounts of inrush current, eliminating damage to components, modules, or devices and generating more precise characteristic I-V curves for components such as LEDs.

Emulate the Response of a Battery

Test a circuit or device under the most realistic conditions by applying a test source with the output resistance that is equivalent to the output resistance of the actual source that will be used to power the circuit or device. For example, a battery has a varying internal resistance, and a device powered by a battery will have a voltage applied to the device that is reduced by the voltage drop across the battery's internal resistance.

Flexible and Fast for Automated Test Systems

With their USB, LAN, or optional GPIB interfaces, 2260B-30-108 will work in any automated system. In addition, this power supply has an analog control capability that can control outputs via an external voltage and resistance. Furthermore, the 2260B-30-108 features fast discharge capability to quickly dissipate the voltage on the output. This power supply also has a fast, 1ms transient recovery time to load changes. This combination of fast discharge time and fast transient response minimizes critical test time in automated test systems.

Create Custom Voltage Source Waveforms

An internal test sequence mode allows the 2260B-30-108 to output a set of voltage levels for varying time intervals at each level. The test sequence can be stored and used repeatedly to determine DUT performance at number of voltage levels. In addition, the analog input control can be used to create voltage profiles that simulate how a battery responds to a fast changing load current requirement such as a large inrush current. Also, generate a combined DC output level with an AC signal superimposed on it to test how a circuit responds to noise on its DC power source. The analog input control parameter can be either a voltage input or a resistance input. With this analog control capability, numerous types of DC supply signals can be generated to test circuits and devices under a wide range of circumstances.