The Keithley 2606B 4-Channel System Sourcemeter (SMU), 20V offers four 20-watt SMU channels in a 1U high form factor chassis. Built from Keithley's third generation SMU technology, the 2606B offers the combined capabilities of a precision power supply, true current source, 6 1/2-digit DMM, arbitrary waveform generator, and pulse generator-all into one tightly integrated instrument. The result is a powerful solution that significantly boosts productivity for demanding automated qualification and production testing for optoelectronic devices such as VCSELs/laser diodes used in 3D sensing, telecommunication, and LEDs used in consumer products and automobiles, as well as integrated devices like analog ICs, ASICs, and system-on-a-chip (SOC) devices. When a high SMU channel count is required, multiple 2606B units can be stacked on top of each other without the need for thermal spacing between units. Built-in web browser-based software enables communicating to the 2606B through any computer from anywhere in the world. For automated system applications, the 2606B's Test Script Processor (TSP) technology runs complete test programs from inside the instrument for industrybest throughput. In larger, multi-channel applications, Keithley's TSP-Link technology works together with TSP technology to enable high-speed, SMU-per-pin parallel testing. Each 2606B SMU is code compatible with the industry leading Keithley 2602B System SourceMeter SMU Instrument when you are using the new ranges.

Nonvolatile Memory

Unmatched Throughput for Automated Test with TSP Technology

For test applications that demand the highest levels of automation and throughput, the 2606B's TSP technology delivers industry-best performance. TSP technology goes far beyond traditional test command sequencers - it fully embeds then executes complete test programs from within the SMU instrument itself. This virtually eliminates time-consuming bus communications to and from the PC controller and thus dramatically improves overall test times.

Channels in TSP-Link System

SMU-Per-Pin Parallel Testing with TSP-Link Technology

TSP-Link is a channel expansion bus that enables multiple Series 2606B's to be inter-connected or connected with other Keithley TSP-enabled instruments and function as a single, tightly-synchronized, multi-channel system. The 2606B's TSP-Link Technology works together with its TSP technology to enable high-speed, SMU-perpin parallel testing. Unlike other high-speed solutions such as large ATE systems, the 2606B achieves parallel test performance without the cost or burden of a mainframe. The TSP-Link based system also enables superior flexibility, allowing for quick and easy system reconfiguration as test requirements change.

SMU-Per-Pin Parallel/Multi-Pin Device Testing

Third-Generation SMU Instrument Design Ensures Faster Test Times

Based on the proven architecture of the Series 2600B instruments, the 2606B's SMU instrument design enhances test speed in several ways. For example, the 2606B uses a patented series ranging topology that provides faster and smoother range changes and outputs that settle more quickly. The 2606B SMU instrument design supports two modes of operation for use with a variety of loads. In normal mode, the SMU instrument provides high bandwidth performance for maximum throughput. In high capacitance (high-C) mode, the SMU instrument uses a slower bandwidth to provide robust performance with higher capacitive loads.