The Phabrix PHQXPO-SDI-STRESS SDI Stress Testing Advanced Toolset Option is designed for stress testing and research and development evaluations of SDI interfaces up to 12G. The PHQXPO-SDI-STRESS provides additional SDI stress testing functions to complement the Physical Layer Analysis instruments and requires a PHQXP01E-3G mezzanine factory-fitted hardware option (not included). This option requires both PHQXPO-UHD and PHQXPO-GEN (not included) for complete operation.

The PHQXPO-SDI-STRESS includes the ability, under automation control, to insert SDI clock jitter from 10 Hz to 10 MHz (128 UI max) peak-to-peak, mute any of the SDI outputs, and control the SDI scrambler, sync-bit insertion, pre-emphasis, rise time and driver amplitude. A comprehensive API is included for rapid automation testing.

The PHQXPO-SDI-STRESS eye amplitude measurement provides both Shorth Mean or Mode with a histogram overlay and an user-defined window for the exploration of eye amplitude.

The Pseudo-Random Binary Sequence (PRBS) generation and analysis of PRBS-7, -9, -15, -23, -31 allows for deterministic measurement of link Bit Error Rates (BER).